IEEE Std 1149.1-2013原版完整文件.docx

IEEE Standard for Test Access Port and Boundary-Scan ArchitectureIEEE Computer SocietySponsored by theTest Technology Standards CommitteeAuthorized licensed use limited to: University of Virginia Libraries. Downloaded on June 18,2014 at 05:29:00 UTC from IEEE Xplore. Restrictions apply.IEEE3 Park AvenueNew York, NY 10016-5997 USA13 May 2013IEEE Std 1149.1-2013(Revision of IEEE Std 1149.1-2001)IEEE Std 1149.1TM-2013(Revision of IEEE Std 1149.1-2001)IEEE Standard for Test Access Port and Boundary-Scan ArchitectureSponsorTest Technology Standards Committeeof theIEEE Computer SocietyApproved 6 February 2013IEEE-SA Standards BoardAbstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language (BSDL), boundary-scan register, circuit boards, circuitry, IEEE 1149.1TM, integrated circuit, printed circuit boards, Procedural Description Language (PDL), test, test access port (TAP), very high speed integrated circuit (VHSIC), VHSIC Hardware Description Language (VHDL).Notice and Disclaimer of Liability Concerning the Use of IEEE Documents: IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. 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Restrictions apply.John Braden Bill Bruce Richard Cornejo Adam Cron Wim Driessen David Dubberke Ted EatonHeiko EhrenbergWilliam Eklow Peter Elias Joshua Ferry Jeff Halnon Dharma KondaRoland R. Latvala Adam W. Ley Sankaran MenonKent NgKenneth P. Parker Francisco Russi John Seibold Roger Sowada Craig Stephan Brian Turmelle Hugh WallaceThe following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention.Gobinathan Athimolom Carl F. BarnhartHugh Barrass William Borroz John Braden Dennis Brophy Susan Burgess Gunnar Carlsson Vivek ChickermaneC. J. Clark Richard Cornejo Adam Cron Alfred Crouch Frans G De Jong Jason Doege Wim Driessen David Dubberke Sourav Dutta Heiko Ehrenberg William Eklow Peter Elias Joshua Ferry Chris Gorringe Prashant Goteti Robert GottliebJ. GrealishRandall Groves Jeff Halnon Peter HarrodNeil Glenn Jacobson Rohit Kapur Dharma Konda Roland R. Latvala Philippe LeBourg Adam W. Ley Teresa LopesGreg Luri Wayne Manges Colin Maunder Ian McintoshHarrison Miles Jr. Jeffrey MooreBenoit Nadeau-Dostie Ion NeagKenneth P. Parker Steve Poehlman Ulrich PohlIrith Pomeranz John Potter Carol Pyron Mike RicchettiGordon RobinsonAndrzej Rucinski Francisco Russi Bartien Sayogo John Seibold Ozgur Sinanoglu Roger Sowada Craig Stephan Cees Stork Walter Struppler Stephen Sunter Bambang Suparjo Anthony Suto Efren Taboada David Thompson Brian Turmelle Bill TuthillLouis Ungar Dmitri Varsanofiev Srinivasa Vemuru John VergisTom Waayers Douglas D. Way Thomas Williams Henk WitOren Yuen Janusz ZalewskiviCopyright © 2013 IEEE. All rights reserved.When the IEEE-SA Standards Board approved this standard on 6 February 2013, it had the following membership:Authorized licensed use limited to: University of Virginia Libraries. Downloaded on June 18,2014 at 05:29:00 UTC from IEEE Xplore. Restrictions apply.Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted BurseClint ChaplinWael William Diab Jean-Philippe Faure*Member EmeritusRichard H. Hulett, ChairRobert Grow, Past ChairKonstantinos Karachalios, SecretaryAlexander Gelman Paul HouzéJim Hughes Young Kyun KimJoseph L. Koepfinger* David J. LawThomas Lee Hung LingOleg Logvinov Ted Olsen Gary RobinsonJon Walter Rosdahl Mike SeaveyYatin Trivedi Phil Winston Yu YuanAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Richard DeBlasio, DOE RepresentativeMichael Janezic, NIST RepresentativeDon MessinaIEEE Standards Program Manager, Document DevelopmentKathryn BennettIEEE Standards Program Manager, Technical Program DevelopmentviiCopyright © 2013 IEEE. All rights reserved.IntroductionThis introduction is not part of IEEE Std 1149.1-2013, IEEE Standard fo