PD IEC PAS 61340-5-6-2022原版完整文件.docx
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1、BSI Standards PublicationPD IEC PAS 61340-5-6:2022ElectrostaticsPart 5-6 : Protection of electronic devices from electrostatic phenomena Process assessment techniquesPD IEC PAS 6134056:2022National forewordThis Published Document is the UK implementation of IEC PAS 6134056:2022.The UK participation
2、in its preparation was entrusted to Technical Committee GEL/101, Electrostatics.A list of organizations represented on this committee can be obtained on request to its committee manager.Contractual and legal considerationsThis publication has been prepared in good faith, however no representation, w
3、arranty, assurance or undertaking (express or implied) is or will be made, and no responsibility or liability is or will be accepted by BSI in relation to the adequacy, accuracy, completeness or reasonableness of this publication. All and any such responsibility and liability is expressly disclaimed
4、 to the full extent permitted by the law.This publication is provided as is, and is to be used at the recipients own risk.The recipient is advised to consider seeking professional guidance with respect to its use of this publication.This publication is not intended to constitute a contract. Users ar
5、e responsible for its correct application.This publication is not to be regarded as a British Standard. The British Standards Institution 2022 Published by BSI Standards Limited 2022ISBN 978 0 539 21855 8ICS 17.220.99; 29.020Compliance with a Published Document cannot confer immunity from legal obli
6、gations.This Published Document was published under the authority of the Standards Policy and Strategy Committee on 30 September 2022.Amendments/corrigenda issued since publicationDateText affectedIEC PAS 61340-5-6 Edition 1.02022-06PUBLICLY AVAILABLE SPECIFICATIONcolour insideElectrostatics Part 5-
7、6: Protection of electronic devices from electrostatic phenomena Process assessment techniquesINTERNATIONAL ELECTROTECHNICAL COMMISSIONICS 17.220.99; 29.020ISBN 978-2-8322-3943-8Warning! Make sure that you obtained this publication from an authorized distributor. Registered trademark of the Internat
8、ional Electrotechnical CommissionPD IEC PAS 6134056:2022 2 IEC PAS 61340-5-6:2022 IEC 2022CONTENTSFOREWORD41.0 PURPOSE, SCOPE, LIMITATION, and EXPERIENCE LEVEL REQUIRED91.1 Purpose91.2 Scope91.3 Limitation91.4 Experience Level Required92.0 ReferenceD PUBLICATIONS93.0 DEFINITIONS104.0 Personnel Safet
9、y105.0 Measurement Techniques FOR ESd Risk Assessment106.0 ESD Robustness of ESDS ITEMS used in Processes126.1 ESD Withstand Currents of Single Devices (Components)136.1.1 Human Body Model136.1.2 Discharge of Charged Conductors136.1.3 Charged Device Model146.2 ESD Withstand Currents of Electronic As
10、semblies146.2.1 Discharge of Charged Personnel146.2.2 Discharge of Charged Conductors146.2.3 Discharge of Boards/Systems157.0 Process Assessment Flow157.1 General Considerations157.2 Manual Handling Steps167.2.1 Introduction167.2.2 Parameter Limits for ESD Process Assessment in Manual Handling Steps
11、167.2.3 Detailed ESD Risk Assessment Flow177.3 Conductors187.3.1 Introduction187.3.2 Parameter Limits for Process Assessment of Conductors197.3.3 Detailed ESD Risk Assessment Flow197.4 Charged ESDS Items207.4.1 Introduction207.4.2 Parameter Limits for Process Assessment of Charged ESDS Items207.4.3
12、Detailed ESD Risk Assessment Flow217.5 Risks Due to Process-Required Insulators237.5.1 Introduction237.5.2 Parameter Limits for Process Assessment of Process-Required Insulators237.5.3 Detailed ESD Risk Assessment Flow247.6 Process Assessment by ESD Event Detection257.6.1 Introduction25IEC PAS 61340
13、-5-6:2022 IEC 2022 3 7.6.2 General Procedure267.6.3 Detailed ESD Risk Assessment Flow26ANNEX A (INFORMATIVE): Measurement TECHNIQUES And EQuipment28A.1 General Considerations28A.2 Measurements of Grounding28A.3 Measurements of Electrostatic Fields31A.4 Measurements of Charges32A.5 Measurements of El
14、ectrostatic Voltages33A.6 Measurements of Discharge Events37A.7 Measurements of Discharge Currents39ANNEX B (INFORMATIVE) PREPARATION: WHAT IS NECESSARY TO . PREPARE AN EFFECTIVE PROCESS EVALUATION?45B.1 Measurement of Temperature, Humidity, and Basic Electrostatic Conditions45B.2 Further Hints for
15、Preparation45ANNEX C (INFORMATIVE) Risk Assessment and Mitigation46ANNEX D (INFORMATIVE) ExampleS for defining limits in process assessment for . Risks Due to Charged Personnel47ANNEX E (INFORMATIVE) Example for CDM risk assessment in a . semiconductor manufacturing line49ANNEX F (INFORMATIVE) Bibli
16、ography53ANNEX g (INFORMATIVE) revision History for ANSI/ESD Sp17.154Table 1 Overview of Possible Measurement Equipment Used for Different Scenarios . to Assess ESD Risk11Table 2 Peak Current Ranges of CDM Discharges of Small and Large Verification Modules for Oscilloscopes with a Bandwidth of 1 GHz
17、 and 6 GHz According to ANSI/ESDA/JEDEC JS-00244Table 3 Recommended Measurement Locations During Process Assessment in Assembly . (Pre-Assembly) of Devices49Table 4 Recommended Measurement Locations During Process Assessment in Device Testing . 50Figure 1 Direct (Best Correlation) and Indirect (Leas
18、t Correlation) Measurements . to Assess an ESD Risk12Figure 2 Flow to Assess ESD Risk Induced by Personnel18Figure 3 Flow to Assess the ESD Risk Induced by Conductors20Figure 4 Flow to Assess the ESD Risk Induced by Charged ESDS Items22Figure 5 Flow to Assess the ESD Risk Induced by Process-Required
19、 Insulators25Figure 6 Flow to Assess the ESD Risk by Detecting the Electromagnetic Radiation . Using ESD Event Detectors or Antennas and Oscilloscopes27Figure 7 Examples of Current Probes40Figure 8 Example of a 4-GHz Pellegrini Target42Figure 9 Commercially Available CDM Test Head Used for Discharge
20、 Current Measurements43Figure 10 Discharge Current Measured in the Field and During Device Qualification 847Figure 11 Examples of Measurements During Semiconductor Assembly and Testing50Figure 12 Schematic of Possible CDM-Like Scenarios During Device Testing52 4 IEC PAS 61340-5-6:2022 IEC 2022INTERN
21、ATIONAL ELECTROTECHNICAL COMMISSIONELECTROSTATICS Part 5-6: Protection of electronic devices from electrostatic phenomena Process assessment techniquesFOREWORD1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnic
22、al committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, T
23、echnical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, gover
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