2022年锁相技术译文翻译 .pdf
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1、锁相技术译文翻译英文原名:An On-Chip All-Digital Measurement Circuit to Characterize Phase-Locked Loop Response in 45-nm SOI 译文:45 纳米 SOI 全数字片上测量电路表征锁相环响应特性名师资料总结 - - -精品资料欢迎下载 - - - - - - - - - - - - - - - - - - 名师精心整理 - - - - - - - 第 1 页,共 13 页 - - - - - - - - - 第 2 页 /共 13 页English 中文An On-Chip All-Digital Me
2、asurement Circuit to Characterize Phase-Locked Loop Response in 45-nm SOI Dennis Fischette, Richard DeSantis, and John Haeseon Lee Advanced Micro Devices, Inc., Sunnyvale, CA 94085-3905 USA AbstractAn all-digital measurement circuit, built in 45-nm SOI-CMOS enables on-chip characterization of phase-
3、locked loop (PLL) response to a self-induced phase step. This technique allows estimation of PLL closed-loop bandwidth and jitter peaking. The circuit can be used to plot step-response vs. time, measure static phase error, and observe phase-lock status. INTRODUCTION Many applications such as PCI Exp
4、ress ? require a PLL to produce a low-jitter clock at a given frequency while meeting stringent bandwidth and jitter peaking requirements. Process, voltage, and temperature (PVT) variations as well as random device mismatch make it difficult to guarantee a narrow range for PLL response. For example,
5、 loop parameters such as VCO gain could vary by more than 2X over PVT corners. In Fig. 1, we see the closed-loop jitter transfer functions of two PLLs with identical reference clock and output frequencies. One PLL exhibits large peaking and low bandwidth while the other shows little peaking but high
6、 bandwidth. Although differences in this example are more extreme than usual, similar but smaller differences often result from PVT variations. 45 纳米 SOI 全数字片上测量电路表征锁相环响应特性作者信息摘要 全数字化测量电路,45 纳米SOI-CMOS工艺使其能够片上表征锁相环(PLL)对自诱导相步进的响应。这种技术允许估计PLL 闭环带宽和抖动峰值。该电路可用于绘制阶跃响应随时间变化的曲线, 测量静态相位误差,并观察相位锁定状态。导言许多应用像
7、PCI Express? 需要一个PLL产生一个低抖动额定频率时钟的同时满足精确带宽和抖动峰值的要求。工艺, 电压和温度( PVT )的变化与器件选用随机性一样会造成失配,使其难以确保PLL的窄带响应。 例如,环路参数如VCO增益变化可能超过PVT角 2 倍上以。图1 中,我们看到两个具有相同参考时钟和输出频率 PLL 的闭环抖动传递函数。一个 PLL展现出大峰值和窄带宽,而另一个则是小峰值宽带宽。 虽然这个例子中显示的差异比通常所见要极端,这种相似而差异的特性往往会因PVT变化而变小。名师资料总结 - - -精品资料欢迎下载 - - - - - - - - - - - - - - - - -
8、 - 名师精心整理 - - - - - - - 第 2 页,共 13 页 - - - - - - - - - 第 3 页 /共 13 页PLL response is often measured on a test bench using signal generators, oscilloscopes, and/or spectrum analyzers. For example, the transfer functions in Fig. 1 were automatically generated by modulating the 100-MHz reference clock w
9、ith various frequencies while observing the amplitudes of the resulting output spurs. Such methods, which may require many seconds to complete, motivate the need for faster, less expensive, and preferably on-chip techniques to characterize PLL response 1-3. Fig. 2 shows the PLL output phase transien
10、t response to an induced phase step. Similar to other second-order feedback systems, the PLL tends to overcorrect (or overshoot) as it works to eliminate the induced phase error. If the PLL is underdamped, as in this example, the PLL may ring several times before settling to its final lock state. A
11、key metric in the PLL step-response is crossover, defined here as the elapsed time from input step to onset of phase overshoot. Another key metric is MaxOvershoot. It measures the maximum overcorrection in the step response. PLL 响应往往是通过一个使用信号发生器、示波器、和/ 或频谱分析仪组成的试验台来测试的。例如, 图 1 中,传递函数是通过调制100MHz能产生各种
12、频率的参考时钟, 同时观察输出马刺产生的幅值自动生成的。 这样的方法, 可能需要若干秒才能完成, 使得对更快、 更便宜方法需求更为迫切, 而最好的方法便是通过片上技术来表征锁相环响应特性1-3。图 2显示了 PLL对致相步进响应的输出瞬态相位。 类似于其他二阶反馈系统,锁相环往往因其工作是消除相位误差而趋于过调 (或过调) 。如果 PLL 工作在欠阻尼状态, 比如在这个例子中,环锁相环可能在其到达最终时钟状态前,经过几次锁定。锁相环阶跃响应的一个关键指标是交叉反应, 在此定义为从输入步进到相位超调开始出现所用的时间。另一个关键指标是最大超调量。 它可以测量阶跃响应的最大过调量。名师资料总结 -
13、 - -精品资料欢迎下载 - - - - - - - - - - - - - - - - - - 名师精心整理 - - - - - - - 第 3 页,共 13 页 - - - - - - - - - 第 4 页 /共 13 页Transient simulations and closed-form loop equations 4 show that crossover is inversely proportional to the PLLs 3dB closed-loop bandwidth; the smaller crossover is, the higher the bandw
14、idth (Fig. 3). Notice that crossover is largely independent of the size of the phase step. Both simulations and loop equations also predict that MaxOvershoot is proportional to the maximum peaking in the closed-loop transfer function; the larger MaxOvershoot is, the greater the peaking (Fig. 4). Not
15、ice that the magnitude of the overshoot is also proportional to the input step size. These relationships between time- and frequency-domain behaviors allow us to make fast time-domain measurements and then relate the results back to frequency-domain performance specifications. The circuit 瞬态模拟和闭环回路方
16、程4 表明,交叉反应和 PLL 的 3dB闭环带宽成反比; 交叉反应越小,带宽越大(图3)。请注意,交叉反应在很大程度上与相位步长无关。模拟和回路方程还预测到闭环传递函数中最大超调与最大峰值是成正比的; 最大超调越大,峰值越高(图4)。请注意,超调幅度也正比于输入步长。时域和频域的这种特性让我们能够进行快速时域测量, 然后将这些结果关联到频域性能指标中。本文呈现的电路实现显示,PLL 阶跃响应可能被全数字化片上有限状态机捕获,从而实现快速表征锁相名师资料总结 - - -精品资料欢迎下载 - - - - - - - - - - - - - - - - - - 名师精心整理 - - - - - -
17、 - 第 4 页,共 13 页 - - - - - - - - - 第 5 页 /共 13 页implementation presented in this paper shows that the PLL step response may be captured by an all-digital, on-chip finite state machine, allowing for fast PLL characterization. Silicon results indicate that this circuit could allow for Power-on calibrat
18、ion of the PLL bandwidth and peaking for compensation of process variations. CIRCUIT DESIGN The PLL under test (Fig. 5) is a standard integer-N charge-pump PLL. The only modification is the addition of loop measurement circuitry. The feedback divisor (N) is programmable from 5 to 63 although N=8 dur
19、ing loop measurement tests. The charge-pump current, loop-filter resistance, and VCO gain are programmable to allow for bandwidth and peaking adjustments as well as jitter optimization. The PLL bandwidth may be configured from 3 to 25 MHz while the peaking may be varied from 4 dB. The VCO operates f
20、rom 1.6 to 5 GHz. The expected reference clock frequency range is 100 to 200 MHz. 环。硅的实验效果表明,该电路可以让PLL 带宽和峰值的电校准工艺变化得到弥补。电路设计被测 PLL(图 5)是一个标准的整数N 电荷泵锁相环。 唯一的修改就是增加了回路测量电路。反馈除数(N)是由 5 至 63可编程的, 虽然在回路测量试验中N=8。电荷泵电流、 循环过滤电阻和VCO增益可编程,以允许带宽和峰值的调整以及抖动的优化。 PLL 带宽可配置为3 到 25MHz ,而峰值可在1 至 4 分贝之间变化。VCO操作频率范围为1
21、.6 到 5GHz 。预期的参考时钟频率范围为100 至 20MHz 。名师资料总结 - - -精品资料欢迎下载 - - - - - - - - - - - - - - - - - - 名师精心整理 - - - - - - - 第 5 页,共 13 页 - - - - - - - - - 第 6 页 /共 13 页A simple way to induce the required input phase step is to flip the polarity of the reference clock so its phase is advanced by half a clock c
22、ycle. A disadvantage to this approach is that the magnitude of the phase step is dependent on the reference clock duty cycle. This is undesirable because overshoot tests require a large and predictable input phase step. Instead, the circuit implementation presented here manipulates the feedback divi
23、sor to induce a known phase step. The circuit then automatically measures the resulting crossover and MaxOvershoot. Fig.6 shows a block diagram of the loop measurement test circuit. It includes three main units: control, crossover detector, and MaxOvershoot detector. The control unit contains two sy
24、nchronizers (to VCO clock), three edge detectors (rising and falling), and logic to enable the induced phase step. The crossover detector includes a bang-bang phase detector, a phase-error change-of-sign detector, and a 10-bit counter. The MaxOvershoot detector contains a feedback count sampler, a c
25、omparator, and a maximum overshoot register. 一个简单的诱发所需输入相位的方法是翻转极性参考时钟使其相位提前半个时钟周期。 这种方法的一个缺点是,相步距大小与参考时钟占空比有关。这是不可取的,因为超调测试需要一个大且可预见输入相位步进。 相反,这里呈现的电路通过操作诱导反馈除数来诱导已知相位步进。该电路将自动测试产生的交叉反应和最大超调量。 图 6 显示了一个环路测量测试电路的框图。 它包括三个主要单元:控制模块、 交叉反应检测器,和最大超调探测器。控制单元包含两个(对VCO时钟的)同步器, 三个(上升和下降) 边沿探测器,和使能致相一步的逻辑。交叉
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