ESD培训手册.ppt
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1、 Towards Zero Defect Caused by ESD Part I Basic ESD Knowledge 第1部分ESD 基础知识 2 Rev.1.0 Confidential ESD 培训手册 2021/9/261 Towards Zero Defect Caused by ESD What is Electrostatic Discharge(ESD)?A sudden transfer of charge between bodies at different electrostatic potentials.Some examples of ESD are:1.Lig
2、htning 2.The“shock”you sometimes feel during winter when you walk across the carpet and touch the door knob 3.The cracking and sparks when you remove clothes from your dryer ESD seems harmless,but it can damage electronic components and assemblies 3 Rev.1.0 Confidential ESD 介绍 2021/9/262Towards Zero
3、 Defect Caused by ESD 什么是静电放电Electrostatic Discharge(ESD)?不同电势物体之间静电荷的瞬间快速转移。ESD 实例:1.闪电 2.在冬天当你走过地毯,接触门把手时可以感觉到“电击”3.当脱毛衣时可以看到的电火花。ESD 看上去是无害的,但它可以损坏电子器件和部件。4 Rev.1.0 Confidential ESD 介绍 2021/9/263Towards Zero Defect Caused by ESD Two main ways in which charges can be built up:产生电荷的两种主要途径:1)By Cont
4、act&Separation of Materials(Triboelectric charging)接触和分离材料(摩擦产生电荷)2)By Induction 感应 5 Rev.1.0 Confidential ESD 介绍 2021/9/264 Towards Zero Defect Caused by ESD Step over of electrons 电子的转移步骤 Remaining charge 剩余电荷 6 Rev.1.0 Confidential 摩擦产生电荷 2021/9/265Towards Zero Defect Caused by ESD *Triboeletric
5、Charging means charge generation by contact and separation of two objects due to a difference in work function 摩擦产生电荷指由接触和分离两个不同物体而得到的电荷。*Factors influencing the magnitude and polarity of charging:影响电势大小和极性的因素:-surface energy states 表面能量状态 -roughness of surface 表面粗糙度 -contact pressure 接触压力 -speed of
6、 separation 分离速度 -surface conductivity(resistance)表面导电性(阻抗)-relative humidity 相对湿度 7 Rev.1.0 Confidential 摩擦产生电荷 2021/9/266 Towards Zero Defect Caused by ESD Event 实例 Relative Hunidity 10-20%65-95%Walking across a carpet 35000 1500 在地毯上行走 Walking across a vinyl floor 12000 250 在塑料地板上行走 Motions of be
7、nch employee 6000 100 在椅子上工作 Picking up plastic paper file 7000 600 拿塑料文件夹 Picking up plastic bag 20000 1000 拿塑料袋 Working chair friction 18000 1500 拖动椅子 8 Rev.1.0 Confidential 典型静电电压/V 2021/9/267 Towards Zero Defect Caused by ESD Charging by Induction 感应产生电荷 Charging Separation in a neutral object 正
8、负电荷在一个中性物体中分离 Charge flow during contact to ground 当接触地时产生放电 Remaining charge after separation 离开地后留存电荷 Remaining charge after removing the Charged jamming object 在移开带电干扰物体后留存电荷 9 Rev.1.0 Confidential 感应产生电荷 2021/9/268Towards Zero Defect Caused by ESD *Catastrophic 破坏性的 -Parts are completely destroy
9、ed as a result of an ESD incident.The failure is most often discovered and required before the instruments is shipped out to customer.器件在一次ESD事件中被完全破坏。这种失效大多可以 在送达客户前的检验中发现。*Latent(Degradation)潜在的(性能衰退)-This type of damage occurs when an ESD only weakens the components.It may pass initial testing bu
10、t fail in the field OR fail prematurely.这种ESD损坏的发生仅仅削弱了性能。它可以通过最初的 电性能测试但会过早的在使用中失效。10 Rev.1.0 Confidential 典型的ESD损伤 2021/9/269Towards Zero Defect Caused by ESD Analysis of non-conforming or defective devices showed that 60-75%were damaged by EOS (electrical overstress)or ESD.This rises to 90%for ne
11、wer technologies.About 70%of these failures were attributed to damage from Incorrectly grounded people.在对不良或有缺陷器件的分析显示,其中60-75%的 损坏来自于ESD和EOS。在技术不断发展的今天已上 升至90%。其中70%的失效源自没有正确接地的操作 者。Toshikazu Namaguchi,Hideka Uchida.EOS/ESD Symposium EOS-20 1998 pp 245-251 11 Rev.1.0 Confidential ESD 损伤 2021/9/2610
12、 Towards Zero Defect Caused by ESD Gate Oxide damage under Polysilicon 多晶硅层下 的栅氧化层 损伤 12 Rev.1.0 Confidential ESD 失效实例 2021/9/2611 Towards Zero Defect Caused by ESD Human Body Model(HBM)人体模式 Machine Model(MM)机器模式 Charged Device Model 充电器件模式 14 Rev.1.0 Confidential ESD 模式 2021/9/2612Towards Zero Defe
13、ct Caused by ESD Human Body Model(HBM)人体模式 *When a charged individual touches a device,some of the stored energy is transferred or discharged either to the device or through the device to ground.当一个带有电荷的个体接触器件时,其储存的强大的能量就会 转移或放电至这个器件,或经过这个器件放电至地。*It is possible to develop human body potentials that
14、far exceed damage ratings of the device 人体产生的静电电压远超过器件的承受力是完全有可能的.15 Rev.1.0 Confidential HBM 模式 2021/9/2613 Towards Zero Defect Caused by ESD 个体放电(未接地)攻击在工作台表面上 的器件(放电从手指-引脚-器件-模块)16 Rev.1.0 Confidential HBM 模式 2021/9/2614 Towards Zero Defect Caused by ESD 人体模式(HBM)测试回路 17 Rev.1.0 Confidential HBM
15、模式2021/9/2615Towards Zero Defect Caused by ESD 机器模式(HBM)测试回路 19 Rev.1.0 Confidential MM 模式 2021/9/2616 Towards Zero Defect Caused by ESD Charged Device Model(CDM)充电器件模式(CDM)*Electrostatic charges get stored up on areas of plastic devices,e.g.leadframe and metal parts of die 静电电荷存储在塑封器件内。如引线框架和芯片的金属部
16、件 *Charges quickly discharge to an effective ground through a low impedance path and cause ESD damage 静电电荷通过一个低阻抗到地迅速放电,造成ESD损伤 *The electrostatic energy stored in the charged device depends on its capacitance which is found to be a function of its orientation with respect to ground.A device close t
17、o ground plane will have large capacitance than that far from the ground plane 充电器件存储的静电能量取决于其电容。而其电容大小和充电器件 与地面方向性相关.与地面接近的器件会有比远离地面的器件更大 的静电电容 21 Rev.1.0 Confidential CDM 模式 2021/9/2617 Towards Zero Defect Caused by ESD 典型的CDM放电事件 金属表面 CDM=充电+快速放电 22 Rev.1.0 Confidential CDM 模式 2021/9/2618 CDM 测试设
18、置 有效的接地 接地平面 23 Rev.1.0 Confidential CDM 模式 Towards Zero Defect Caused by ESD 2021/9/2619 Towards Zero Defect Caused by ESD The low ohmic discharge of a charged device(CDevice)e.g.charged by sliding in a production line is described by the Charged Device Model(CDM).The CDM failure is one of the main
19、 failure mechanisms in automatic production lines.带电器件的低阻值放电-如在生产线上的滑动充电可以认为是CDM。充电器件模式失效是一种在自动生产线 上主要的失效机制。24 Rev.1.0 Confidential CDM 模式 2021/9/2620Towards Zero Defect Caused by ESD 实时ESD图谱 脉冲宽度 Real ESD Spectrum ESD Models Pulse Width s 10-9 10-8 10-7 CDM MM HBM 10-11 10-10 10-9 10-8 Rise Time s
20、上升时间 26 Rev.1.0 Confidential 使用中的ESD模式和ESD引力 2021/9/2621Towards Zero Defect Caused by ESD *MIL STD 883 D,method 3015.7,1989 *ANSI EOD/ESD S5.1 1993(ESD Association)(ESD协会)*JESD22-A114-B 2000 (JEDEC)Further Standards:EIAJ Japan 更多的标准 CECC Europe Company Standards product standards(chip cards:ISO/IEC1
21、0373)27 Rev.1.0 Confidential HBM 标准 2021/9/2622Towards Zero Defect Caused by ESD Damage caused by invisible and undetectable events can be by comparing ESD damage to medical contamination of human body by virus or bacteria.Although viruses and bacteria are invisible,they can cause severe damage even
22、 before you can detect their presence.A defense against this invisible threat is sterilization.ESD损伤是无形的和无法发觉的事件,类似于人体来自于病 毒和细菌的医学污染。尽管病毒和细菌是无形的,他们也 能在你察觉它们的到来前造成多种损伤。杀菌是一种抵制 无形威胁的防护。30 Rev.1.0 Confidential 静电沾污的随想 2021/9/2623 Towards Zero Defect Caused by ESD *JESD22-A115-A 1997 under revision (JED
23、EC)*ANSI EOD/ESD S5.2-1999 *Automotive Electronics Council -AEC-Q100-003-REV-E 28 Rev.1.0 Confidential MM 标准 2021/9/2624Towards Zero Defect Caused by ESD Summary for Part 1 第一部分的小结 1.Charges are generated by 2 ways:电荷积累产生于2种途径:a)Triboeletric Charging 摩擦产生电荷 b)Induction 感应 2.Type of Damages caused by
24、 ESD:ESD损伤类型:a)Catastrophic 完全的损坏 b)Latent(Degradation)潜在的损坏(性能下降)3.The 3 ESD Models are:3种ESD模式 a)HBM 人体模式 b)MM 机器模式 c)CDM 充电器件模式 4.Static can be considered as a contamination problem 静电可以认为是一种沾污问题。31 Rev.1.0 Confidential ESD基本知识 2021/9/2625Towards Zero Defect Caused by ESD Part II Concept of ESD C
25、ontrol 第二部分 ESD控制的概念 32 Rev.1.0 Confidential ESD 控制 2021/9/2626Towards Zero Defect Caused by ESD Majority of products are designed to serve 3 functions 大多数ESD控制产品被设计成可提供以下3种功能 1)Grounding 接地 2)Isolation 隔离 3)Neutralization 中和 33 Rev.1.0 Confidential ESD 控制的基本概念 2021/9/2627Towards Zero Defect Caused
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