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1、集成电路工艺和版图设计概述Jian FangIC Design Center,UESTCIC常用术语园片:硅片芯片(Chip,Die):6、8:硅(园)片直径:1 25.4mm6150mm;8200mm;12300mm;亚微米1m的设计规范深亚微米 0反型层 沟道源(Source)S漏(Drain)D栅(Gate)G栅氧化层厚度:50埃1000埃(5nm100nm)VT阈值电压电压控制N N沟沟MOSMOS(NMOSNMOS)P型衬底,受主杂质;栅上加正电压,表面吸引电子,反型,电子通道;漏加正电压,电子从源区经N沟道到达漏区,器件开通。N衬底p+p+漏源栅栅氧化层场氧化层沟道P P沟沟MOS
2、MOS(PMOSPMOS)GDSVTVGSID+-VDS 0 N型衬底,施主杂质,电子导电;栅上加负电压,表面吸引空穴,反型,空穴通道;漏加负电压,空穴从源区经P沟道到达漏区,器件开通。CMOS CMOS:Complementary Symmetry Metal Oxide Semiconductor 互补对称金属氧化物半导体特点:低功耗VSSVDDVoViCMOS倒相器PMOSNMOSI/OI/OVDDVSSCCCMOS传输门N-SiP+P+n+n+P-阱DDVoVGVSSSSVDDCMOS倒相器截面图CMOS倒相器版图pwellactivepolyN+implantP+implantomi
3、contactmetalA NMOS ExamplepwellPwellActivePolyN+implantP+implantOmicontactMetalNtype SiSiO2光刻胶光刻胶光光MASK PwellNtype SiSiO2光刻胶光刻胶光刻胶光刻胶MASK PwellNtype SiSiO2光刻胶光刻胶光刻胶光刻胶SiO2Ntype SiSiO2SiO2PwellpwellactivePwellActivePolyN+implantP+implantOmicontactMetalNtype SiSiO2PwellSiO2光刻胶光刻胶MASK activeMASK Active
4、Si3N4Ntype SiSiO2PwellSiO2光刻胶光刻胶光刻胶光刻胶MASK activeMASK ActiveSi3N4Ntype SiSiO2PwellSiO2光刻胶光刻胶光刻胶光刻胶Si3N4Ntype SiSiO2PwellSiO2场氧场氧场氧场氧场氧场氧PwellPwellSi3N4Ntype SiSiO2Pwell场氧场氧场氧场氧场氧场氧PwellPwellNtype SiSiO2PwellSiO2场氧场氧场氧场氧场氧场氧PwellPwellpolyactivepwellpolyPwellActivePolyN+implantP+implantOmicontactMetal
5、Ntype SiSiO2PwellSiO2MASK poly场氧场氧场氧场氧场氧场氧PwellPwellpoly光刻胶光刻胶Ntype SiSiO2PwellSiO2MASK poly场氧场氧场氧场氧场氧场氧PwellPwell光刻胶光刻胶polyNtype SiSiO2PwellSiO2场氧场氧场氧场氧场氧场氧PwellPwellpolyNtype SiSiO2PwellSiO2场氧场氧场氧场氧场氧场氧PwellPwellpolyactivepwellpolyN+implantPwellActivePolyN+implantP+implantOmicontactMetalNtype SiSiO2PwellSiO2MASK N+场氧场氧场氧场氧场氧场氧PwellPwellpoly光刻胶光刻胶Ntype SiSiO2PwellSiO2场氧场氧场氧场氧场氧场氧PwellPwell光刻胶光刻胶polyN+implantS/DactivepwellpolyP+implantPwellActivePolyN+implantP+implantOmicontactMetalNtype SiSiO2PwellSiO2MASK N+场氧场氧场氧场氧场氧场氧PwellPwellpoly光刻胶光刻胶光光S/D
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