[精选]集成电路的基本制造工艺教材14950.pptx
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1、半导体集成电路1.双极集成电路的基本工艺2.双极集成电路中元件结构2023/5/24pn+n-epin+P-Sin+-BLCBESP+P+双极集成电路的基本工艺2023/5/24P-SiTepiCBEpn+n-epin+P-SiP+P+Sn+-BLTepiAATBL-uptepi-oxxmcxjc四层三结结构的双极晶体管双极集成电路中元件结构2023/5/24ECB相关知识点隐埋层的作用、电隔离的概念、寄生晶体管 MOSMOS集成电路的工艺集成电路的工艺 PP阱阱CMOSCMOS工艺工艺 BiCMOSBiCMOS集成电路的工艺集成电路的工艺 NN阱阱CMOSCMOS工艺工艺 双阱双阱CMOSC
2、MOS工艺工艺2023/5/24MOS 晶体管的动作 MOS 晶体管实质上是一种使电流时而流过,时而切断的 开关 开关n+n+P 型硅基板栅极(金属)绝缘层(SiO2)半导体基板漏极源极N N 沟 沟MOS MOS 晶体管的基本结构 晶体管的基本结构源极(S)漏极(D)栅极(G)2023/5/24silicon substratesource draingate gateoxide oxideoxide oxidetop nitridemetal connection to sourcemetal connection to gatemetal connection to drainpolys
3、ilicon gatedoped siliconfield oxidegate oxideMOS 晶体管的立体结构2023/5/24在硅衬底上制作MOS 晶体管silicon substrate2023/5/24silicon substrateoxide oxidefield oxide2023/5/24silicon substrateoxide oxidephotoresist photoresist2023/5/24Shadow on photoresistphotoresist photoresistExposed area of photoresistChrome platedgl
4、ass maskUltraviolet Lightsilicon substrateoxide oxide2023/5/24非感光区域silicon substrate感光区域oxide oxidephotoresist photoresist2023/5/24Shadow on photoresistsilicon substrateoxide oxidephotoresist photoresistphotoresist显影2023/5/24silicon substrateoxide oxideoxide oxidesilicon substratephotoresist photore
5、sist腐蚀2023/5/24silicon substrateoxide oxideoxide oxidesilicon substratefield oxide去胶2023/5/24silicon substrateoxide oxideoxide oxidegate oxide gate oxidethin oxide layer2023/5/24silicon substrateoxide oxideoxide oxidepolysilicon polysilicongate oxide2023/5/24silicon substrateoxide oxideoxide oxidega
6、tegate gateultra-thin gate oxidepolysilicongate2023/5/24silicon substrateoxide oxideoxide oxidegategate gatephotoresist photoresistScanning direction of ion beamimplanted ions in active region of transistorsImplanted ions in photoresist to be removed during resist strip.source drainion beam2023/5/24
7、silicon substrateoxide oxide oxide oxidegategate gatesource draindoped silicon2023/5/24自对准工艺1.在有源区上覆盖一层薄氧化层2.淀积多晶硅,用多晶硅栅极版图刻蚀多晶硅3.以多晶硅栅极图形为掩膜板,刻蚀氧化膜4.离子注入2023/5/24silicon substratesource draingate gate2023/5/24silicon substrategate gatecontact holesdrain source2023/5/24silicon substrategate gatecont
8、act holesdrain source2023/5/24完整的简单MOS 晶体管结构silicon substratesource draingate gateoxide oxideoxide oxidetop nitridemetal connection to sourcemetal connection to gatemetal connection to drainpolysilicon gatedoped siliconfield oxidegate oxide2023/5/24CMOSFETP 型 si subn+gate gateoxide oxiden+gate gateo
9、xide oxideoxide oxidep+p+2023/5/24VDDP 阱工艺N 阱工艺双阱工艺P-P+P+N+N+P+N+VSSVOUTVINVDDN-P+P+N+N+P+N+VSSVOUTVINVDDP-P+P+N+N+P+N+VSSVOUTVINN-SiP-SiN-I-SiN+-Si2023/5/24掩膜1:P 阱光刻P-wellP-well N+N+P+P+N+P+N-SiP2023/5/24具体步骤如下:1 生长二氧化硅(湿法氧化):Si(固体)+2H2O SiO2(固体)+2H22023/5/242023/5/242 P 阱光刻:涂胶 涂胶 腌膜对准 腌膜对准曝光 曝光光源显
10、影 显影2023/5/242023/5/24硼掺杂(离子注入)硼掺杂(离子注入)刻蚀(等离子体刻蚀)刻蚀(等离子体刻蚀)去胶 去胶P+去除氧化膜 去除氧化膜P-well3 P 阱掺杂:2023/5/242023/5/24离子源 离子源高压 高压电源 电源电流积分器离子束 离子束2023/5/24掩膜2:光刻有源区有源区:nMOS、PMOS 晶体管形成的区域P+N+N+P+N-SiP-wellP-wellP-well 淀积氮化硅 光刻有源区 场区氧化 去除有源区氮化硅及二氧化硅SiO2隔离岛2023/5/24有源区depositednitride layer有源区光刻板N 型p 型MOS 制作区
11、域(漏-栅-源)2023/5/24P-well1.淀积氮化硅:氧化膜生长(湿法氧化)P-well氮化膜生长P-well涂胶P-well对版曝光有源区光刻板2.光刻有源区:2023/5/24P-well显影P-well氮化硅刻蚀去胶3.场区氧化:P-well场区氧化(湿法氧化)P-well去除氮化硅薄膜及有源区SiO22023/5/24掩膜3:光刻多晶硅P-well去除氮化硅薄膜及有源区SiO2P-wellP+N+N+P+N-SiP-well栅极氧化膜多晶硅栅极 生长栅极氧化膜 淀积多晶硅 光刻多晶硅2023/5/24P-well生长栅极氧化膜P-well淀积多晶硅P-well涂胶光刻多晶硅光刻
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